Conference Programme

The conference programme is available as pdf here.

Pre-Conference Avizo Workshop

Title: Introduction to Thermo Scientific™ Avizo™ Software for Industrial Inspection
Instructor: Andreas Staude
Day and time: Feb 06, 2018 – 9:00AM – 12:00PM
Workshop outline: General introduction to Avizo™ Software for industrial inspection

This course consists of a lecture and hands-on exercises intended for new or existing users of Avizo™ Software. The material covered in this course will introduce advanced 3D solutions for digital inspection and materials analysis highlighting the important features of Avizo Software for industrial inspection.

After a quick introduction, attendees will have the opportunity to ask questions, see live demonstrations, and use the Avizo Software. Attendees must bring their own Laptop with suitable 3D graphics board for course participation. Thermo Fisher Scientific will e-mail instructions about software distribution and installation up to one week in advance of the course. Temporary licenses will be provided.

Hands-on session:

  • Material characterization (porosity and fiber analysis)
  • Defect analysis
  • Dimensional metrology
  • Automated analysis and inspection workflows
  • Reporting and traceability

Programme Committee

  • Johann Kastner (FH OÖ Campus Wels/AT)
  • Gerhard Aufricht (ÖGfZP, Vienna/AT)
  • Markus Bartscher (PTB, Brunswick/DE)
  • Giovanni Bruno (BAM, Berlin/DE)
  • Simone Carmignato (Univ. of Padua/IT)
  • Leonardo De Chiffre (Technical Univ. of Denmark, Lyngby/DK)
  • Marius Costin (CEA LIST, Institut Carnot, Saclay/FR) 
  • Wim Dewulf (KU Leuven, Leuven/BE)
  • Gustavo Donatelli (CERTI, Florianópolis/BR)
  • Alexander Flisch (EMPA, Dübendorf/CH)
  • Trey Gordon (Boeing, Seatle/US)
  • Eduard Gröller (TU Vienna/AT)
  • Randolf Hanke (University Würzburg/DE)
  • Christoph Heinzl (FH OÖ Campus Wels/AT)
  • Jakobus Hoffman (Necsa, Pretoria/SA)
  • James Hunter (Los Alamos National Laboratory/US)
  • Valerie Kaftandjian (CEA LIST, Institut Carnot, Saclay/FR) 
  • Stefan Kasperl (FhG-EZRT, Fürth/DE)
  • Javier Llorca (IMdea, Madrid/ES)
  • Andrew Malcom (Singapore Institute of Manufacturing Technology, SG)
  • Michael Maisl (DGZfP and FhG-IZfP Saarbrücken/DE)
  • Frank Muecklich (Univ. Saarbrücken/DE)
  • Lars Pejryd (University of Örebro, ÖREBRO/SE)
  • Guillermo C. Requena (DLR, Köln/DE)
  • Katja Schladitz (FhG-ITWM, Kaiserslautern/DE)
  • Jan Sijbers  (University of Antwerp, Antwerpen/BE)
  • Rainer Stössel (Airbus Group Innovations, Munich/DE)
  • Hiromasa Suzuki (University of Tokyo/JP)
  • Takatsuji Toshiyuki (National Metrology Institue of Japan, Tsukuba/JP)
  • Daniel Vavrik (CTU, Prague/CZ)
  • Norman Uhlmann (FhG-IIS, Fürth/DE)
  • Philip Withers (University of Manchester/UK)
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